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| Dublin City University, National Centre for Sensor Research Contact Prof. Dermot Diamond at 01-7005404 or |
| Full suite of surface characterisation incl VHV – STM, AFM, ESCH, SEM (EDX) |
| Optical microscopy |
| FABRICATION (Hot embossing, Laser machining) |
| Synthesiser, Surface Patterning |
| Dublin Institute of Technology Contact Dr. Hugh Byrne at 01-4024929 or |
| Raman Microscopy |
| UV/Visible/NIR spectroscopy |
| Fluorescence Spectroscopy |
| FTIR microscopy |
| Spectral Polarimetry |
| Confocal Laser Scanning Fluorescence microscopy |
| Transient Fluorescence Spectroscopy |
| Transient Absorption Spectroscopy |
| White Light Interferometric Surface Profiler |
| Enterprise Ireland, Glasnevin, Dublin 9 Contact Dr. Denis Dowling at 01-8082403 or |
| Wear tester (Pin-on-Disk) |
| Abrasion tester |
| Thickness measurement |
| Surface roughness (laser profilometer 1 mm – 1nm) |
| Microhardness hardness testers |
| Adhesion testers |
| Glancing angle XRD |
| Contact angle measurement |
| SEM/ microprobe, surface area measurement |
Coating Deposition Systems
Plasma / Deposition Monitoring Equipment
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| University of Limerick, Materials and Surface Science Institute (MSSI) Contact Dr Edmond Magner at 061-202629 or email |
| Atomic Force Microscope (AFM) |
| Transmission Electron Microscope (TEM) |
| Focussed Ion Beam Milling |
| Spectroscopic Ellipsometer |
| X-Ray Diffractometer including High Temperature, Glancing Angle and |
| Controlled Atmosphere Capabilities (XRD) |
| Materials & Interface Modelling (MIM) |
| Raman Spectrometer |
| Gas Chemisorption and Physisorption System |
| X-Ray Photoelectron Spectrometer (XPS) |
| Particle Size Analyser – Zetasizer |
| University of Limerick, Materials Ireland Research Centre (MIRC) Contact Dr. David O'Sullivan at 061-202357 or |
| Nano-Powder processing facilities |
| Laser Diffraction Particle Size Analyser (PSA) |
| Fabrication facilities for manufacture of ceramic nanomaterials |
| Facilities for pressureless sintering of nanoceramics |
| Thermal Analysis: DTA, DSC, Dilatometry |
| X-Ray Fluorescence (XRF) |
| FTIR (including microprobe) |
| Optical microscopy and image analysis |
| Profilometer |
| Wear testing |
| Ultrasonic probe for elasticity measurements |
| University of Limerick, Dept. of Materials Science & Technology Contact Dr. Jeremy Robinson at 061-202240 or |
| Scanning Electron Microscope (SEM) |
| NMRC, University College Cork Contact Liz Folan O'Connor at 021-4904329 or |
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Thin Films A range of thin films is available which can be deposited by either Physical Vapour Deposition (PVD) or Chemical Vapour Deposition (CVD) techniques. A wide range of metals are available e.g.: aluminium, aluminium alloys, copper, platinum, gold, titanium and tungsten. The choice of inorganic dielectric films includes silicon dioxide, silicon nitride and silicon oxynitride. The organic dielectrics include SU8 (up to a thickness of 300mm), polyimide and BCB. |
Etching There are a number of etch technologies available. For minimum dimensions dry etching is recommended although there are a number of specialised wet technologies such as crystallagraphically selective bulk silicon etching. Dry etch techniques are based on chlorine and fluorine chemistries and techniques include Inductively Coupled Plasma (ICP), Reactive Ion Etching (RIE) and Magnetic Zero Resonant Induction etching (MORITM). These techniques give a very broad etch capability from nm resolution to etches which are several hundred mm deep. |
Lithography There are a number of lithography systems that can be used. Patterns down to sub micron feature sizes may be transferred using optical lithography techniques however for nanoscale images the Electron Beam (E-Beam) lithography system is recommended. The E-Beam is a direct write system with a minimum resolution of 20nm and can handle a wide range of sample sizes. |
Substrate Doping Substrates can be doped using high temperature furnace techniques or ion implantation with Rapid Thermal Annealing for shallow implants. |
Materials and Device Characterisation Extensive facilities are available for nanoscale structural, optical and electrical characterisation of novel materials and devices including, e.g., FESEM, AFM, FIB, STM, spectroscopic NSOM and variable temperature magnetoelectrical measurement systems. |
| University College Cork, Chemistry Dept. Contact Dr. Justin Holmes at 021-4903608 or |
| X-ray Diffraction (XRD) |
| X-ray Fluorescence (XRF) |
| Solid State Nuclear Magnetic Resonance (NMR) |
| Transmission Electron Microscopy TEM-STM |
| Atomic Force Microscopy (AFM) |
| N2 BET adsorption |
| Powder X Ray Diffraction (XRD) |
| Magic Angle Spinning Nuclear Magnetic Resonance |
| BET surface area |
| Nanoindentor |
| University College Galway, Chemistry Department Contact Dónal Leech at 091-512149 or |
| Custom assembled potentiostat for high-speed electrochemistry |
| Potentiostats (CH Instruments, Autolab, Metrohm, BioAnalytical Systems, Pine Instruments) |
| Digital Instruments Scanning Probe Microscope (Nanoscope III with EC-AFM and EC-STM) |
| BiaCore 2000 surface plasmon resonance spectrometer |
| Shimadzu AIM-8800 FT-Infrared Microscope |
| Micromass GCT GC-MS |
| Micromass QTof mass spectrometer coupled to Waters HPLC system |
| Beckmann-Coulter Capillary Electrophoresis system with Diode-Array and Laser-Induced Fluorescence detection |
| Agilent HPLC with diode array detection |
| Agilent diode-array UV-Visible spectrophotometer |
| Hitachi S-4700 Field Emission SEM fitted with an Oxford Instruments "INCA" |
| X-ray analysis system |
| Hitachi H-7500 TEM |
| University College Galway, National Centre for Laser Applications Contact Dr. Richard Sherlock at 091-750469 or |
| Laser sources including UV and ultrafast |
| White light profilometer |
| Spectroscopy |
| Scanning Electron Microscopy (SEM) |
| Transmission Electron Microscopy (TEM) |
| Laser Scanning Confocal Microscopy |
| Atomic Force Microscopy (AFM) |
| Trinity College Dublin , Chemistry Dept. Contact Dr. Sylvia Draper at 01-6082026 or |
| CCD diffractometer |
| Bruker high field NMR spectrometer |
| Transmission Electron Microscopy (TEM) |
| High resolution Transmission Electron Microscopy (HRTEM) |
| Scanning Electron Microscopy (SEM) |
| ES mass spectrometry |
| Trinity College Dublin , Physics Dept. Contact Dr. Valerie Barron or Dr. Johnny Coleman at 01-6083595, or |
| Atomic Force Microscope (AFM) |
| Plasma generator |
| Static & Dynamic Contact angle |
| Ultra High Vacuum Scanning Tunnelling Microscope (STM) |
| Ultra high vacuum low temperature STM |
| Thermopiezic analyser |
| Confocal optical microscopy |
| Various LASER systems, including a femtosecond multiwavelength system |
| Optical, electrical and magnetic resonance material characterisation |
| Reflection High Energy Electron DiffractionChemical vapour deposition |
| Pulsed laser deposition (JGL) |
| Electrodeposition (MEGL) |
| FTIR plus microscope |
| University of Ulster Contact Prof. James McLaughlin at +44 (0)28 9036 8933 or jad.mclaughlin@ulster.ac.uk |
| Sputtering |
| Sol gel and micro fabrication |
| X-Ray Reflectometry |
| Specialised Laboratory Provision (c/f SRIF) |
| Reactive Ion/Atom surface modification |
| Photonics Measurement Laboratory |
| Optical Spectrometer |
| Filtered Cathodic Vacuum Arc (FCVA) |
| Cell Culture Facility |
| Q-Sense Quartz Crystal Microbalance (QCM) |
| Rapid Thermal Annealing |
| Multi-target Depostion Upgrade |
| Large Area Profilometer |
| Chemical Microscope (Static SIMS) |
| Atomic Force Microscopy (AFM) |
| Nanoindentor |
| X-Ray Photoemission Spectroscopy (XPS) |
| Secondary Ion Mass Spectroscopy (SIMS) |
| Auger |
| Low Energy Ion Spectroscopy (LEIS) |
| CSM nanomechanical measurement |
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